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Annual Workshop on Advanced Atomic Force Microscopy Techniques
AFM-Workshop

3rd Workshop in 2012
 

2nd Workshop in 2011
 

1st Workshop in 2010

Course on Surface Analysis Using Atomic Force Microscopy and Related Techniques
 IMT logo written with AFM

December 3, 2012

Seminar Room of the Institute of Microstructure Technology (Campus North)

Course Programme

3rd International Workshop on Advanced Atomic Force Microscopy Techniques 2012

 

 

3rd International Workshop on

 

Advanced Atomic Force Microscopy Techniques

March 5-6, 2012

Karlsruhe Institute of Technology (Campus North)

Organizers:
Hendrik Hölscher (Institute of Microstructure Technology, KIT)
Thomas Schimmel (Institute of Nanotechnology, KIT)

Invited Speakers:
Wilhelm Barthlott (University of Bonn)
József Fortágh (University of Tübingen)
Ricardo Garcia (IMM Madrid)
Stanislav Gorb (CAU Kiel)
Armin Knoll (IBM Zürich)

Egbert Oesterschulze (TU Kaiserslautern)
Pascal Ruffieux (EMPA)
Markus Ternes (MPI Stuttgart)

Programme:
The final programme can be found here.

Conference Photo AAFMT 2012

Special Volume of the Beilstein Journal of Nanotechnology: 
There will be a Special Volume of the Beilstein Journal of Nanotechnology on Advanced Atomic Force Microscopy Techniques, and all participants of the AAFMT 2012 are invited to contribute a manuscript. The Beilstein Journal of Nanotechnology is an open access journal funded by the Beilstein Organization, a non-profit organization for the support of science. The Beilstein Journal of Nanotechnology is ISI referenced and listed in PubMed and Chemical Abstracts of the American Chemical Society.

Your original article will be published directly after acceptance by the referees and copyediting. You are free to send a Letter, a Full Articles or a Review Article. When your article has passed the refereeing process, it will be immediately published in the Beilstein Journal as a regular article. After all articles are complete, they are collected and printed a second time for the Special Volume. Please submit your article until July 15, 2012 directly to www.bjnano.org and follow the Author´s Instructions. Please indicate in your Letter of Submission that the Article is part of the Thematic Issue “Advanced Atomic Force Microscopy Techniques” edited by Thilo Glatzel, Hendrik Hoelscher and Thomas Schimmel.

 _______________________________________________________________________________
For further information please contact:
Hendrik Hölscher, Institute of Microstructure Technology, Karlsruhe Institute of Technology,
Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen,
Tel.: +49 721 608-22779, Fax: +49 721 608-24331