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Telefon: +49 721 608-22779

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Lehrveranstaltungen und mehr…

Annual Workshop on Advanced Atomic Force Microscopy Techniques
AFM-Workshop

4th Workshop in 2013

 

3rd Workshop in 2012

2nd Workshop in 2011

1st Workshop in 2010

Course on Surface Analysis Using Atomic Force Microscopy and Related Techniques
 IMT logo written with AFM

December 5, 2013

Seminar Room of the Institute of Microstructure Technology (Campus North)

Course Programme

4th International Workshop on Advanced Atomic Force Microscopy Techniques 2013

 

 

 

4th International Workshop on

 

Advanced Atomic Force Microscopy Techniques

March 4-5, 2013

Karlsruhe Institute of Technology (Campus North)

Organizers:
Hendrik Hölscher (Institute of Microstructure Technology, KIT)
Thomas Schimmel (Institute of Nanotechnology, KIT)

Invited Speakers:
Daniel Ebeling (University of Maryland)
Andreas Günther (University of Tübingen)
Shigeki Kawai (University of Basel)
Angelika Kühnle (University of Mainz)
Jacob Sagiv (Weizmann Institute of Science)
Tilman Schäffer (University of Tübingen)


The final program can be found here.

The best poster award was sponsored by SPECS Surface Nano Analysis GmbH. From left to right: Daniel Ebeling (Chairman of the Award Committee), Takumi Hiasa (3rd prize), Markus Kittelmann (2nd prize), Robert Lindner (1st prize), Hendrik Hölscher and Thomas Schimmel (Conference Chairmen)

Special Volume of the Beilstein Journal of Nanotechnology: 
There will be a Special Volume of the Beilstein Journal of Nanotechnology on Advanced Atomic Force Microscopy Techniques and all participants of the AAFMT 2013 are invited to contribute a manuscript. The Beilstein Journal of Nanotechnology is an open access journal funded by the Beilstein Organization, a non-profit organization for the support of science. The Beilstein Journal of Nanotechnology is ISI referenced and listed in PubMed and Chemical Abstracts of the American Chemical Society. Your original article will be published directly after acceptance by the referees and copyediting. You are free to send a Letter, a Full Articles or a Review Article. When your article has passed the refereeing process, it will be immediately published in the Beilstein Journal as a regular article. After all articles are complete, they are collected and printed a second time for the Special Volume. Please submit your article until July 15, 2013 directly to www.bjnano.org and follow the Author´s Instructions. Please indicate in your Letter of Submission that the Article is part of the Thematic Issue “Advanced Atomic Force Microscopy Techniques” edited by Thilo Glatzel and Thomas Schimmel.

 

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For further information please contact:
Hendrik Hölscher, Institute of Microstructure Technology, Karlsruhe Institute of Technology,
Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen,
hendrik hoelscherHwx3∂kit edu, phone: +49 721 608-22779, FAX: +49 721 608-24331