Talk:Main Page: Difference between revisions
From IMT-Wiki
Jump to navigationJump to search
Wensheng.Yan (talk | contribs) No edit summary |
m (WikiSysop moved page Talk:Hauptseite to Talk:Main Page) |
||
| (26 intermediate revisions by 2 users not shown) | |||
| Line 1: | Line 1: | ||
== Hilfreiche Tools== |
|||
Excel zu Wikitabelle: |
|||
[http://tools.wmflabs.org/magnustools/tab2wiki.php] |
|||
Device location: F&E4-SOLAR LAB |
|||
Lab location: Building 310 Room no. 203 |
|||
Phone number: |
|||
Lab leader: Ulrich Wilhelm Paetzold |
|||
Principal users: Ulrich Wilhelm Paetzold, Wensheng Yan. |
|||
Access: Only trained and authorized users may use the setup. |
|||
Contents [hide] |
|||
== '''Short Description''' == |
|||
WCT-120 instruments showcase our unique measurement and analysis techniques, including the highly regarded Quasi-Steady-State Photoconductance (QSSPC) lifetime measurement method developed by Sinton Instruments in 1994. The QSSPC technique is ideal for monitoring multicrystalline wafers, dopant diffusions, and low-lifetime samples. This method complements the use of the transient photoconductance technique that is also standard on this instrument.The QSSPC lifetime measurement also yields the implied open-circuit voltage (versus illumination) curve, which is comparable to an I-V curve at each stage of a solar cell process. |
|||
WCT System Capabilities: |
|||
Primary application: Step-by-step monitoring and optimization of a fabrication process. |
|||
Other applications: |
|||
• Monitoring initial material quality |
|||
• Detecting heavy metals contamination during wafer processing |
|||
• Evaluating surface passivation and emitter dopant diffusion |
|||
• Evaluating process-induced shunting using the implied I-V measurement |
|||
'''Start-up Procedure''' |
|||
== Headline text == |
|||
Standard Operating Procedure: |
|||
Assembly Equipments |
|||
Stages : WCT-120 & Suns-Voc |
|||
Flash Lamp Assembly |
|||
Bulb & Reflector |
|||
Power Supply |
|||
Flash Lamp Trigger |
|||
Flash Lamp Tower |
|||
Filters |
|||
Neutral Density Filters |
|||
IR Pass Filter |
|||
Visible Pass blue filter |
|||
Adjustable height Stand |
|||
Data Acquisition System |
|||
Connector Box |
|||
BNC Cables , thermocouple & other Probes |
|||
PCI Card connection with Computer |
|||
Precautions: |
|||
1.Do NOT touch the filters or the filter tray which has glass diffuser glued into it, with bare |
|||
hands. Use gloves or tissue paper for the same. |
|||
2.Make sure that the filter tray/flash mount assembly does NOT fall down while sliding it over the flash tower for adjusting height of the flash. |
|||
3.Ensure that the BNC cable and flash trigger connections are in place based on the measurement to be done i.e. to lifetime tester stage or Suns VOC stage. |
|||
4.Note down the height of the flash from the stage, the setting on the flash (1/1 or 1/64) and the filter being used during measurement. Different users tend to change this according to their requirements. |
|||
5.Make sure that the reference cell is NOT covered during the measurement. |
|||
6.Do NOT start the measurement on Lifetime tester until it is thermally stabilized i.e. Red LED is OFF. |
|||
7.During chemical passivation, ensure that solution does NOT spill on the stage. |
|||
8.For Suns VOC measurement, ensure that sample consists of P-N junction and both P N sides can be probed properly. |
|||
9.Ensure that proper action is taken for addressing error messages in the measurement:i.Saturated reference cell: Height of the flash is adjusted to change the intensity of light to avoid saturation of reference cell.ii.Min MCD < Specified MCD < Max MCD: Change the specified minority carrier density to fit in the measured range of minority carrier density.iii.Remove the sample on lifetime tester stage during zeroing of the instrument: No sample in the vicinity of stage during zeroing of the instrument. |
|||
10.Ensure that SUMMARY file is NOT cut pasted during the data transfer: |
|||