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Revision as of 11:52, 18 November 2019
Janis Heuer
Funktionsbereich: FuE 1 - BSS, Prof. Dr. Hölscher
Aufgabengebiet: Correlated Characterisation
Bau: 307
Raum: 338
Telefon: 0721-608-23128
e-mail: mailto:Janis.Heuer@kit.edu
Tätigkeitsbeschreibung
I am working on correlated characterization, with focus on combining vertical scanning interferometry (VSI), atomic force microscopy (AFM) and time-of-flight secondary ion Mass Spectrometry (ToF-SIMS)
Fertigkeiten/Kenntnisse
Geräte
Vertical scanning interferometer (VSI)
Atomic force microscope (AFM)
Scanning electron microscope (SEM)
Raman spectrometer
Prozesse
Software
Office
Imagemet SPIP
Gwyddion
Bruker Vision 64
AutoCAD
Materialien
Publikationen
Heuer, J; Luttge, A.: Kinetics of pipeline steel corrosion studied by Raman Spectroscopy coupled Vertical Scanning Interferometry (RC-VSI): From Mean Rates to Rate Spectra. npj Materials Degradation 2, article number: 40 (2018)
