Focused Ion Beam (FIB)

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English Version


Gerätebezeichnung: Focused Ion Beam (FIB)

Geräteverantwortliche/Operateure: Torsten Scherer

Standort: Institut für Nanotechnologie (INT)


Kurzbeschreibung

Alternativen

ohne Trennfunktion:

  • REM
  • AFM

Spezifikationen des Geräts

Etablierte Prozesse

Einschränkungen

Eingewiesene Nutzer

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