EQE Measurement system: Difference between revisions
From IMT-Wiki
Jump to navigationJump to search
No edit summary |
No edit summary |
||
| Line 3: | Line 3: | ||
'''Device name:''' Oerlikon QUE System V2.0 |
'''Device name:''' Oerlikon QUE System V2.0 |
||
'''Device responsibles/Operators:''' |
'''Device responsibles/Operators:''' [[User:Stephan.Dottermusch|Stephan Dottermusch]], [[User:Malte.Langenhorst|Malte Langenhorst]] |
||
'''Location:''' R203 |
'''Location:''' R203 |
||
Latest revision as of 15:26, 10 April 2018
Device name: Oerlikon QUE System V2.0
Device responsibles/Operators: Stephan Dottermusch, Malte Langenhorst
Location: R203
Prüfmittel-/Fertigungsmittelnummer: XXXX
Specification number: SP-XXXX
Short description
Device for the measurement of the external quantum efficiency (EQE) of a solar cell.
Alternatives
Specifications of the device
- Wavelength: 300nm-1100nm
- Bias light: white, blue, red
- Sample size: 100 x 100 mm
