EQE Measurement system
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Device name: Oerlikon QUE System V2.0
Device responsibles/Operators: Stephan Dottermusch, Malte Langenhorst
Location: R203
Prüfmittel-/Fertigungsmittelnummer: XXXX
Specification number: SP-XXXX
Short description
Device for the measurement of the external quantum efficiency (EQE) of a solar cell.
Alternatives
Specifications of the device
- Wavelength: 300nm-1100nm
- Bias light: white, blue, red
- Sample size: 100 x 100 mm
