Seminar on Surface Analysis Using Scanning Probes and Related Techniques

Preliminary Program

November 16, 2018

Seminar Room (Rm 405) of the Institute of Microstructure Technology
(Campus North, Blg. 301)

09:30	Introduction to KNMF Structure and Procedures (Richard Thelen, IMT)
09:45	Atomic Force Microscopy (Stefan Walheim, INT)
10:45	Coffee break
11:15	Transmission Electron Microscopy (Georgian Melinte, INT)
12:00	Lunch break
13:00	Probing thin films and nanostructures under UHV conditions (Bärbel Krause, IPS)
13:45	XPS and ToF-SIMS (Vanessa Trouillet, IAM)
14:30	Coffee break
15:00	Combining Equipment for Advanced Measurement Tasks (Richard Thelen, IMT)
15:30	Dip-Pen Nanolithography (Michael Hirtz, INT)
16:15	Closure & End of course

Please send a short email to richard.thelen∂kit.edu to register.

last change: 2018-11-07 KIT – The Research University in the Helmholtz Association