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Seminar on Surface Analysis Using Scanning Probes and Related Techniques

 

 

Preliminary Program

Surface Analysis Using Scanning Probes and Related Techniques

 November 16, 2018

Seminar Room (Rm 405) of the Institute of Microstructure Technology
(Campus North, Blg. 301)

 
09:30 Introduction to KNMF Structure and Procedures (Richard Thelen, IMT)
09:45 Atomic Force Microscopy (Stefan Walheim, INT)
10:45 Coffee break
11:15 Transmission Electron Microscopy (Georgian Melinte, INT)
12:00 Lunch break
13:00 Probing thin films and nanostructures under UHV conditions (Bärbel Krause, IPS)
13:45 XPS and ToF-SIMS (Vanessa Trouillet, IAM)
14:30 Coffee break
15:00 Combining Equipment for Advanced Measurement Tasks (Richard Thelen, IMT)
15:30 Dip-Pen Nanolithography (Michael Hirtz, INT)
16:15 Closure & End of course

Please send a short email to richard.thelen∂kit.edu to register.