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Hendrik Hölscher
PD Dr. Hendrik Hölscher
Biomimetic Surfaces and Scanning Probe Technologies

Phone: +49 721 608-22779
hendrik hoelscherSzx3∂kit edu

Staff webpage

International Workshop on Advanced Scanning Probe Microscopy Techniques
AAFMT-Workshop

5th Workshop in 2014

4th Workshop in 2013

3rd Workshop in 2012

2nd Workshop in 2011

1st Workshop in 2010

Seminar on Surface Analysis Using Scanning Probes and Related Techniques
IMT logo written with AFM

November 17, 2016

Seminar Room of the Institute of Microstructure Technology (Campus North)

Seminar Program

1st International Workshop on Advanced Atomic Force Microscopy Techniques 2010

 

 

 

1st International Workshop on

 

Advanced Atomic Force Microscopy Techniques

March 1-2, 2010

Karlsruhe Institute of Technology (Campus North)

Organizers:
Hendrik Hölscher (Institute of Microstructure Technology, KIT)
Thomas Schimmel (Institute of Nanotechnology, KIT)

Invited Speakers:
Ricardo García (Madrid Microelectronics Institute)
Christoph Gerber (University of Basel)
Leo Gross (IBM Zürich)
Kerstin Koch (Rhine-Waal University of Applied Sciences)
Mark Lantz (IBM Zürich)
Ernst Meyer (University of Basel)
André Schirmeisen (University of Münster)
Alexander Schwarz (University of Hamburg)


Please follow this link for the final program

 

 Group Foto AAFMT 2010