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Hendrik Hölscher
PD Dr. Hendrik Hölscher
Biomimetic Surfaces and Scanning Probe Technologies

Phone: +49 721 608-22779
hendrik hoelscherIat0∂kit edu

Staff webpage

International Workshop on Advanced Scanning Probe Microscopy Techniques

5th Workshop in 2014

4th Workshop in 2013

3rd Workshop in 2012

2nd Workshop in 2011

1st Workshop in 2010

Seminar on Surface Analysis Using Scanning Probes and Related Techniques
IMT logo written with AFM

November 17, 2016

Seminar Room of the Institute of Microstructure Technology (Campus North)

Seminar Program

4th International Workshop on Advanced Atomic Force Microscopy Techniques 2013




4th International Workshop on


Advanced Atomic Force Microscopy Techniques

March 4-5, 2013

Karlsruhe Institute of Technology (Campus North)

Hendrik Hölscher (Institute of Microstructure Technology, KIT)
Thomas Schimmel (Institute of Nanotechnology, KIT)

Invited Speakers:
Daniel Ebeling (University of Maryland)
Andreas Günther (University of Tübingen)
Shigeki Kawai (University of Basel)
Angelika Kühnle (University of Mainz)
Jacob Sagiv (Weizmann Institute of Science)
Tilman Schäffer (University of Tübingen)



The final program can be found here.





The best poster award was sponsored by SPECS Surface Nano Analysis GmbH. From left to right: Daniel Ebeling (Chairman of the Award Committee), Steffen Prein (SPECS), Takumi Hiasa (3rd prize), Markus Kittelmann (2nd prize), Robert Lindner (1st prize), Hendrik Hölscher and Thomas Schimmel (Conference Chairmen)

For further information please contact:
Hendrik Hölscher, Institute of Microstructure Technology, Karlsruhe Institute of Technology,
Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen,
hendrik hoelscherOle3∂kit edu, phone: +49 721 608-22779, FAX: +49 721 608-24331