Institute of Microstructure Technology (IMT)

5th International Workshop on Advanced Scanning Probe Microscopy Techniques 2014

 

 

 

5th International Workshop on

 

Advanced Scanning Probe Microscopy Techniques

February 24-25, 2014

Karlsruhe Institute of Technology (Campus North)

Organizers:
Hendrik Hölscher (Institute of Microstructure Technology, KIT)
Thomas Schimmel (Institute of Nanotechnology, KIT)

Invited Speakers:
Kirsten von Bergmann (Universität Hamburg)
Stefan Heinze (Carl-Albrechts-Universität zu Kiel)
Diethelm Johannsmann (TU-Clausthal)
Hideki Kawakatsu (The University of Tokyo)
Fabian Pauly (Universität Konstanz)
Heike Riel (IBM Research Zürich)
Sascha Sadewasser (International Iberan Nanotechnology Laboratory)

 

Conference Photo ASXMT 2014

 

Programme:
The final programme can be found here.

 

 

Best Poster Award:
A Best Poster Award was granted to the authors of the three best poster presentations by SPECS Surface Nano Analysis GmbH. The winners were Tim Sander (1. Prize, University of Erlangen-Nuremberg), Shigeki Kawai (2. Prize, University of Basel) und Christian Steiner (3. Prize, University of Erlangen-Nuremberg)

Best Poster Prize ASXMT 2014

 

 Special Volume of the Beilstein Journal of Nanotechnology:
There will be a Special Volume of the Beilstein Journal of Nanotechnology on Advanced Atomic Force Microscopy Techniques and all participants of the ASXMT 2014 are invited to contribute a manuscript. The Beilstein Journal of Nanotechnology is an open access journal funded by the Beilstein Organization, a non-profit organization for the support of science. The Beilstein Journal of Nanotechnology is ISI referenced and listed in PubMed and Chemical Abstracts of the American Chemical Society. Your original article will be published directly after acceptance by the referees and copyediting. You are free to send a Letter, a Full Articles or a Review Article. When your article has passed the refereeing process, it will be immediately published in the Beilstein Journal as a regular article. After all articles are complete, they are collected and printed a second time for the Special Volume. Please submit your article until July 15, 2014 directly to www.bjnano.org and follow the Author´s Instructions. Please indicate in your Letter of Submission that the Article is part of the Thematic Issue “Advanced Atomic Force Microscopy Techniques” edited by Thilo Glatzel and Thomas Schimmel.

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For further information please contact:
Hendrik Hölscher, Institute of Microstructure Technology, Karlsruhe Institute of Technology,
Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen,
hendrik.hoelscher∂kit.edu, phone: +49 721 608-22779, FAX: +49 721 608-24331