Preliminary Program
Surface Analysis Using Scanning Probes and Related Techniques
November 16, 2018
Seminar Room (Rm 405) of the Institute of Microstructure Technology
(Campus North, Blg. 301)
| 09:30 |
Introduction to KNMF Structure and Procedures (Richard Thelen, IMT) |
| 09:45 |
Atomic Force Microscopy (Stefan Walheim, INT) |
| 10:45 |
Coffee break |
| 11:15 |
Transmission Electron Microscopy (Georgian Melinte, INT) |
| 12:00 |
Lunch break |
| 13:00 |
Probing thin films and nanostructures under UHV conditions (Bärbel Krause, IPS) |
| 13:45 |
XPS and ToF-SIMS (Vanessa Trouillet, IAM) |
| 14:30 |
Coffee break |
| 15:00 |
Combining Equipment for Advanced Measurement Tasks (Richard Thelen, IMT) |
| 15:30 |
Dip-Pen Nanolithography (Michael Hirtz, INT) |
| 16:15 |
Closure & End of course |
Please send a short email to richard.thelen∂kit.edu to register.
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